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| Title: | 監控相依品質變數比之變異數的 EWMA 管制圖
EWMA Control Chart for Monitoring Variance of Ratio of Correlated Quality Variables |
| Authors: | 陳韋豫
Chen, Wei-Yu |
| Contributors: | 楊素芬
蕭又新
Yang,Su-Fen
陳韋豫
Chen, Wei-Yu |
| Keywords: | 相依品質變數比
變異數管制圖
Ratio of correlated variables
Variance control chart |
| Date: | 2023 |
| Issue Date: | 2023-08-02 13:04:20 (UTC+8) |
| Abstract: | 在品質管制的領域中，我們常使用管制圖來監控製程以提升產出的品質。在眾多產業中，追蹤相依品質變數之間的比例變化相當重要。在過去，文獻上對於監控相依品質變數比的平均值或變異數的管制圖研究較少。因此，如何監控相依品質變數比的平均數或變異數的製程管制圖是值得探討的。
本研究提出三種監控相依品質變數比的變異數管制圖，分別以符號檢定(sign test)方法、Mood (1954)的Rank test與Siegel & Tukey (1960)檢定兩分配變異數是否相同的檢定方法運用於建立相依變數比的變異數管制圖。本文在考慮不同的二元分配之下評估所提出的管制圖的表現，並與文獻中的比例變異數管制圖進行比較。最後，以半導體資料說明我們所提出的三種相依品質變數比的變異數管制圖的應用。
In quality control, control charts are commonly used to monitor processes. In many industries, monitoring the proportions of correlated process variables is crucial. Currently, there has been less research on control charts for monitoring the mean or variance of ratio of correlated process variables.
This study proposes three control charts for monitoring the variance of ratio of two correlated process variables. These control charts combine the sign test method, the Rank test method for dispersion proposed by Mood (1954), and the test for differences in variability proposed by Siegel & Tukey (1960). Moreover, the performance of the proposed control charts is evaluated under different bivariate distributions and also compared with some existing control charts from the literature. Additionally, the application of the three proposed control charts for monitoring the variance of ratio between two correlated process variables is demonstrated using semiconductor data. |
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| Description: | 碩士
國立政治大學
統計學系
110354013 |
| Source URI: | http://thesis.lib.nccu.edu.tw/record/#G0110354013 |
| Data Type: | thesis |
| Appears in Collections: | [統計學系] 學位論文
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