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    題名: 型II截略抽樣計劃下之加速壽命試驗
    Accelerated Life Testing Under Type II Censoring Sample Plan
    作者: 陳燕禎
    貢獻者: 曾勝滄
    陳燕禎
    日期: 1989
    上傳時間: 2016-05-04 14:24:07 (UTC+8)
    參考文獻: 參考資料
    [1]張東生博士論文"挑選最可靠設計之研究，The Study on Selecting the Most Reliable Design" (1989)
    [2] Kielpinski. T. J. and Nelson W(1975) "Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions " ,1EEE Transaction Reliability, Vol R-24,No.5.pp310-320
    [3]Kielpinski, T.J.and Nelson W.(1976),”Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions", Technometrics, Vol.18. No.l, pp 171-177.
    [4] Mann N.R., Schafer,R.E., and Singpurwalla, N.D.(1974), Methods for Statistical Analtsis of Reliability and Life Data. John Wiley and Sons. New York.
    [5]Meeker, W.Q. and Nelson W.,(1975)"Optimum Accelerated Life Tests for the Weibull and Extreme Value Distributions". IEEE Transactions on Reliability. Vol. R-24. No.5. pp 321-332.
    [6] Meeker, W. Jr and Hahn G.J.,(1977), “Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability". Technoruetrics, Vol.19. No.4. pp 381-404
    [7] Neeker, W. Q. and Nelson W.,(1978), "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value ,Distributions." Technometrics, Vol.20, No.2, pp 171-177.
    [8] Meeker. W.Q. Jr. (1984). "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring". Technometrics. Vol.25. 110.2. pp 105-114.
    [9] Nelson, W. (1980). "Accelerated Life Testing Step-Stress Models and Data Analysis". IEEE Transactions on Reliability. Vol.R-29 No.2 PP 103-108.
    [10] Nelson, W., (1982) Applied Life Data Analysis. General Electric Co., New York .
    [11] Nelson.W.,"Analysis of Accelerated Life Test Data". IEEE. Transaction on Electrical Insulation. "Part I. The Arrhenius model and Graphical Methods",Vol.E1-6,No.4,1971,pp165-181,"partⅡ.Numerical Methods and Test Planing",EI-7,No.1.1972.pp36-55, "PartⅢ.Product Comparisons and Checks on the Validity of the Hodel and Data",EI-7,No.2,1972,pp 99-119.
    [12] Sweeny, H.C. and Gaylor ,D.W.(1965),"Design for Optimal Prediction in Simple Linear Regression", Journal of American Statistical Association,pp205-216
    [13] Tobias, P.A., Trindade. D.C,(1986),Applied Reliability Van Nostrand Reinhold Company, New York.
    描述: 碩士
    國立政治大學
    統計學系
    資料來源: http://thesis.lib.nccu.edu.tw/record/#B2002005729
    資料類型: thesis
    顯示於類別:[統計學系] 學位論文

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