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| Title: | 半導體業生產績效作業層面影響因素之實地實證研究 |
| Authors: | 龔志忠
Kung, Chih-Chung |
| Contributors: | 吳安妮
Ann Wu
龔志忠
Kung, Chih-Chung |
| Keywords: | 生產績效
晶圓製造
作業制成本制
半導體產業
manufacturing performance
wafer production
activity based costing
semiconductor |
| Date: | 2001 |
| Issue Date: | 2016-04-15 16:11:05 (UTC+8) |
| Abstract: | 對晶圓代工產業而言：生產的彈性及穩定的高良率是競爭優勢之所在，為維持這兩項核心能力，企業必須持續改進製程以提高生產績效。Vadgama, Trybula (1996)曾對晶圓廠生產績效之改善提出建議方案：作者認為將模型工具與作業制成本制整合的管理方式，可辨認出對生產績效具有重大影響的生產區域，再以作業分析找出影響因素並提出相對應的解決方案，進而達到持續改善的目標。 |
| Reference: | 一、中文部份
中華開發工業銀行，2000，2000年重點產業景氣預測（Π）：72-79.。
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李惠娟，2000，半導體產業設備產能使用效率影響因素之實證研究，國立政治大學會計研究所未出版碩士論文。
周文賢，多變量統計分析：SAS/STAT使用方法，待出版書稿。
科普朗與庫柏（Kaplan, R. S., and R. Cooper），2000，成本與效應：以整合性成本制度提昇獲利與績效，徐曉慧譯，台北：臉譜。
黃俊穎，1999，晶圓製造廠因應產品組合更動之快速生產規劃機制，國立交通大學工業工程與管理研究所未出版碩士論文。
簡煌煜，1997，產出績效衡量指標之研究，國立交通大學工業工程與管理研究所未出版碩士論文。
詹偉順，1997，晶圓製造廠生產績效指標關係模式之構建，國立交通大學工業工程與管理研究所未出版碩士論文。
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張俊彥，鄭晃忠，1997，積體電路製程及設備技術手冊，台北：中華民國產業科技發展協進會。
二、英文部份
Adachi, T., C. L. Moodie, and J. J. Talavang. 1995. A pattern-recognition-based method for controling a multi-loop production system. International Journal Production Research Vol.26 No.12: 1943-1957.
Atherton, L. F., and R. W. Atherton. 1995. Wafer fabrication: factory performance and analysis. Kluwer Academic Publishers: 209-243.
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Chen, Y. J., Y. J. Su, M. S. Hong, and I. Wang. 2000. Real-time dispatching reduces cycle time. Semiconductor International (March): 109-111.
Chu, K. F., and H. Yan. 1999. Efficient setup/ dispatching policies in a semiconductor manufacturing facility. Proceedings of the 38th Conference on Decision & Control: 1368-1373.
Demeester, L., and C. S. Tang. 1996. Reducing cycle time at an IBM wafer fabrication facility. Interfaces Vol.26 No2: 39-49.
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Narahari, Y., and L. M. Khan. 1997. Modeling the effevtof hot lots in semiconductor manufacturing system. IEEE Transactions on Semiconductor Manufacturing Vol.10 No.1 (February): 185-188.
Page, M. 1996. The free factory: cutting cycle time and gaining output. IEEE/SEMI advanced Semiconductor Manufacturing Conference: 146-150.
Vadgama, A., and W. Trybula. 1996. Activity based enterprise analysis through modeling. IEEE/CPMT Electronics Manufacturing Technology Symposium: 123-129.
Yan, H., S. Lou, S. Sethi, A. Gardel, and P. Deosthali. 1996. Testing the robustness of two-Boundary control policies in semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing Vol.9 No.2 (May): 285-288. |
| Description: | 碩士
國立政治大學
會計學系 |
| Source URI: | http://thesis.lib.nccu.edu.tw/record/#A2002001376 |
| Data Type: | thesis |
| Appears in Collections: | [會計學系] 學位論文
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