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    题名: Understanding as well as characterization of erratic interspike dynamics in semiconductor devices
    作者: 蕭又新
    Shiau,Yuo-Hsien
    贡献者: 應物所
    日期: 2011.01
    上传时间: 2014-09-25 12:22:09 (UTC+8)
    摘要: The understanding of the origin of electronic noise would be very important in semiconductor devices. Detecting time characteristics via statistical approaches has been known to be useful in complex systems. In this study, the ensemble Monte Carlo particle method is used to simulate electron transport in a layered III–V semiconductor at room temperature. Nonlinear/erratic spiking fluctuations are predominant at the onset of current instabilities. To explore time characteristics detrended fluctuation analysis is used to analyze interspike intervals in different scales. Interestingly, multifractal behaviors are responsible for this kind of electronic noise. Therefore, it indicates that many extra time-characteristic would emerge in semiconductor devices, which would be strongly related to polar optical phonon scattering for intervalley transfer.
    關聯: Solid State Communications,151(2),135-138
    数据类型: article
    DOI 連結: http://dx.doi.org/http://dx.doi.org/10.1016/j.ssc.2010.11.005
    DOI: 10.1016/j.ssc.2010.11.005
    显示于类别:[應用物理研究所 ] 期刊論文

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