政大機構典藏-National Chengchi University Institutional Repository(NCCUR):Item 140.119/152576

政大機構典藏-National Chengchi University Institutional Repository(NCCUR):Item 140.119/152576

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政大典藏 > College of Informatics > Department of Computer Science > Theses > Item 140.119/152576

Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/152576

Title:	在半導體製造中推進數據隱私保護:對 CycleGAN 處理的晶圓圖進行縮略圖保留加密 Advancing Data Privacy in Semiconductor Manufacturing: Thumbnail Preserving Encryption for CycleGAN-Processed Wafer Images
Authors:	黃浚綾 Huang, Chun-Lin
Contributors:	曾一凡 Tseng, Yi-Fan 黃浚綾 Huang, Chun-Lin
Keywords:	縮略圖保留加密 CycleGAN CycleGAN Thumbnail preserving encryption
Date:	2024
Issue Date:	2024-08-05 12:46:38 (UTC+8)
Abstract:	鑒於實際生產線上相對較缺乏有缺陷的晶圓圖，其收集面臨時間限制的挑戰。為了解決晶圓圖中缺陷模式的資料不平衡問題，我們使用 CycleGAN 深度學習網路來開發一個缺陷模式生成解決方案。由於存在硬體設備損壞的風險，我們將生成的晶圓圖存儲在雲端，並以一種類似縮略圖保留加密的方案，使密文呈現明文的低解析度本，在隱私和安全性之間取得平衡。這個方法旨在提供使用者可用性，同時透過增加缺陷模式的訓練樣本數來促進自動化生產效率。獲得的結果表明，生成的有缺陷晶圓圖與真實的有缺陷晶圓圖非常相似，並且我們計算生成的有缺陷晶圓圖在不同的縮略圖保留加密方案下的峰值訊噪比，以評估其安全性。實驗結果顯示，生成的晶圓圖在R-LSB方案中具有較低的峰值訊噪比及較高的安全性。 Given the limited availability of defective wafer images on actual production lines, there are challenges associated with time constraints in their collection. To address the data imbalance issue concerning defect modes in wafer images, we utilize CycleGAN deep learning networks to devise a defect mode generation solution. Due to the risk of hardware damage, we store the generated wafer images in the cloud and employ an scheme similar to thumbnail preserving encryption to achieve a balance between privacy and security by presenting ciphertext in a low-resolution version of plaintext. This approach aims to provide user accessibility while enhancing automated production efficiency through an increased number of training samples for defect modes. The obtained results indicate a high resemblance between the generated defective wafer images and authentic defective wafer images. Furthermore, we compute the Peak Signal-to-Noise Ratio of the generated defective wafer images under various TPE schemes to assess their security. Experimental results demonstrate that the generated wafer images exhibit lower PSNR values and higher security under the R-LSB scheme.
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Description:	碩士國立政治大學資訊科學系 111753210
Source URI:	http://thesis.lib.nccu.edu.tw/record/#G0111753210
Data Type:	thesis
Appears in Collections:	[Department of Computer Science ] Theses

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