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    題名: Commensurate dimensionality reduction for extended local ternary patterns
    作者: Liao, Wen-Hung
    廖文宏
    貢獻者: 資科系
    關鍵詞: Comparative analysis;Contributory factors;Descriptors;Dimensionality reduction;Feature vectors;Image sets;Local ternary patterns;Noise resistance;Non-uniform patterns;Texture classification;Software engineering;Pattern recognition
    日期: 2012
    上傳時間: 2015-04-10 16:38:23 (UTC+8)
    摘要: We present a systematic approach to reduce the dimensionality of the feature vector for local binary/ternary patterns. The proposed framework examines the distribution of uniform patterns in different image sets to formulate a procedure to assign dimensionality to uniform and non-uniform patterns. Unlike previous methods where all the information from non-uniform patterns is discarded or merged into a single dimension, the proposed commensurate dimensionality reduction (CDR) technique attempts to retain valuable information from all contributory factors. Experiments and comparative analysis have validated the efficacy of the newly defined CDR-ELTP descriptor in terms of noise resistance and texture classification. © 2012 ICPR Org Committee.
    關聯: Proceedings - International Conference on Pattern Recognition
    資料類型: conference
    顯示於類別:[資訊科學系] 會議論文

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