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政大機構典藏 > 理學院 > 應用物理研究所 > 期刊論文 > Item 140.119/70511

Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/70511

Title:	Investigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurement
Authors:	李尚凡 Huang,S. Y.;Liang,J. J.;Hsu,S. Y.;Lin,L. K.;Tsai,T. C.;Lee,S. F.
Contributors:	應物所
Date:	2011-01
Issue Date:	2014-10-09 15:51:56 (UTC+8)
Abstract:	A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu0.5Ni0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.
Relation:	European Physical Journal B,79(2),153-162
Data Type:	article
DOI 連結:	http://dx.doi.org/10.1140/epjb/e2010-10051-y
DOI:	10.1140/epjb/e2010-10051-y
Appears in Collections:	[應用物理研究所 ] 期刊論文

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