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    題名: 韋柏分配下規格下限與X-bar 管制圖之經濟設計
    Economic design of specification limit and X-bar control chart under Weibull distribution
    作者: 蔡瑋倫
    Tsai, Wei Lun
    貢獻者: 楊素芬
    蔡瑋倫
    Tsai, Wei Lun
    關鍵詞: 經濟設計
    X-bar 管制圖
    規格界限
    韋柏分配
    Economic design
    X-bar control chart
    Specification limit
    Weibull distribution
    日期: 2012
    上傳時間: 2013-07-01 17:00:56 (UTC+8)
    摘要: To determine the economic design of control charts and the specification limits with minimum cost are two separate issues in previous research areas. In this study, we proposed a method to determine the optimal design parameters of X control charts and the specification limits simultaneously from an economic viewpoint. We also consider two types of X control charts: one is the economic X control chart and the other is the economic statistical X control chart. We obtain the optimal results by minimizing the expected cost per unit time for the-larger-the-better quality characteristic with a Weibull distribution. We
    consider the asymmetric control limits because of the asymmetric feature of theWeibull distribution. Also, we are considering the difference between monitoring the process by
    using an economic statistical X control chart and conducting a complete inspection plan.
    Which way is better, process control or inspection plan?
    In our data analysis of the two types of X control chart, we find that the optimal expected cost per unit time with complete inspection is lower than without complete
    inspection. This is because the coefficient of Taguchi’s quadratic loss function we set is too small. And the analysis shows us the significant parameters for the optimal expected cost per unit time and design parameters.
    At last, in our numerical examples for two different types of X control chart, we find that the performance of the economic X control chart is as good as the economic statistical one. However, we suggest the producer use the economic statistical X control chart with a complete inspection plan to obtain a lower expected cost per unit time and larger power of the control chart.
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    [2] Chen, Y.K. and Chiou, K.C. (2005), “Optimal design of VSI X control charts for monitoring correlated samples,” Quality and Reliability Engineering International, 21(8), 757-768.
    [3] Chen, C.H. and Khoo, M.B.C. (2008), “Joint determination of optimum process mean and economic specification limits for rectifying inspection plan with inspection error,”Journal of the Chinese Institute of Industrial Engineers, 25(5), 389-398.
    [4] Cho, B. R. and Phillips, M. D. (1998), “Design of the optimum product specifications for S-type quality characteristics,” International Journal of Production Research, 36(2), 459-474.
    [5] Chou, C. Y., Chen, C.H. and Chen, C.H. (2006b), “Economic design of variable sampling intervals T-square control charts using genetic algorithms,” Expert Systems
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    [6] Chou, C.Y., Chen, C.H. and Liu, H.R. (2006a), “Economic design of EWMA charts with variable sampling intervals,” Quality and Quantity, 40(6), 879-896.
    [7] Chou, C.Y., Liu, H.R., Chen, C.H. and Huang, X.R. (2002), “Economic-statistical design of multivariate control charts using quality loss function,” Advanced
    Manufacturing Technology, 20(12), 916-924.
    [8] Duncan, A. J. (1956), “The economic design of X charts used to maintain current control of a process,” Journal of the American Statistical Association, 51(274),228-242.
    [9] Duncan, A. J. (1971), “The economic design of X charts when there is a multiplicity of assignable causes,” Journal of the American Statistical Association, 66(333),107-121.
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    [12] Erto, P., Pallotta, G. and Park, S. H. (2008), “An example of data technology product: a control chart for Weibull processes,” International Statistical Review, 76(2), 157-166.
    [13] Feng, Q. and Kapur, K.C. (2006), “Economic development of specifications for 100% inspection based on asymmetric quality loss function,” IIE Transactions, 38(8),
    659-669.
    [14] Filho, J. C. S. S. and Yacoub, M. D. (2006), “Simple precise approximations to Weibull sums,” IEEE Communications Letters, 10(8), 614-616.
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    [17] Lorenzen, T. J. and Vance, L. C. (1986), “The economic design of control charts: a unified approach,” Technometrics, 28(1), 3-10.
    [18] Montgomery, D. C. (1980), “The economic design of control charts: a review and literature survey,” Journal of Quality Technology, 12(2), 75-87.
    [19] Panagos, M. R., Heikes, R. G. and Montgomery, D. C. (1985), “Economic design of X control charts for two manufacturing process models,” Naval Research Logistics
    Quarterly, 32, 631-646.
    [20] Phillips, M. D. and Cho, B. R. (1998), “An empirical approach to designing product specifications: A case study,” Quality Engineering, 11(1), 91-100.
    [21] R Core Team (2012). R: A language and environment for statistical computing. R Foundation for Statistical Computing, Vienna, Austria. ISBN 3-900051-07-0, URL
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    [22] Taguchi, G. (1984), “The role of metrological control for quality control,” Proceedings of the International Symposium on Metrology for Quality Control in Production, 1-7.
    [23] Tang, K. (1988), “Economic design of product specifications for a complete inspection plan,” International Journal of Production Research, 26(2), 203-217.
    [24] Torng, C.C., Lee, P.H. and Liao, N.Y. (2009), “An economic-statistical design of double sampling X control chart,” International Journal of Production Economics,
    120(2), 495-500.
    [25] Vommi, V.B. and Seetala, M.S.N. (2007), “A new approach to robust economic design of control charts,” Applied Soft Computing, 7(1), 211-228.
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    描述: 碩士
    國立政治大學
    統計研究所
    99354006
    101
    資料來源: http://thesis.lib.nccu.edu.tw/record/#G0099354006
    資料類型: thesis
    顯示於類別:[統計學系] 學位論文

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