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    政大機構典藏 > 商學院 > 統計學系 > 學位論文 >  Item 140.119/36665
    Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/36665


    Title: 檢驗誤差對單位缺點數管制圖的影響
    Authors: 李茂和
    Contributors: 楊素芬
    李茂和
    Date: 2001
    Issue Date: 2009-09-18 19:09:38 (UTC+8)
    Abstract: 建立單位缺點數管制圖的過程中,若發生缺點誤認為非缺點和非缺點誤認為缺點二種檢驗誤差,那麼檢驗誤差會如何影響管制圖的管制界限,且該採取哪些對策,以減少影響,是本研究之主題。
    透過操作特性曲線的分析,了解在各種條件下樣本單位缺點數落在管制界限內之機率,且可得知在檢驗誤差存在時,調整後的管制界限,是能追蹤製程現況的好的管制圖管制界限。
    If there will be two kinds of inspection error during setting up U-control Chart. These two inspection errors are checking the defects as non-defects and non-defects as defects. How do these two inspection errors affect the control limits of U-chart ? What strategy is suitable for those situation ? It`s the topic of this article.
    According to the analysis of Operation Characteristic Curve, we will know the probability that unit defects fall in control limits under several conditions. Using an adjusted U-chart limits is good while inspection errors exist.
    Description: 碩士
    國立政治大學
    統計研究所
    86354005
    90
    Source URI: http://thesis.lib.nccu.edu.tw/record/#G91NCCU1942012
    Data Type: thesis
    Appears in Collections:[統計學系] 學位論文

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