| Reference: | Mann et al. (1974). Methods for Statistical Analysis of Reliability and Life Data, New York: Wiley.
Miller, R. and Nelson, W. (1983). Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transactions on Reliability, 32, 59-65.
Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York: Wiley.
Meeker, W. Q. and Escobar, L. A. (1993). A Review of Recent Research and Curren Issues in Accelerated Testing, International Statistical Review, 61, 147-168.
Xiong, C. (1998). Inferences on A Simple Step-Stress Model with Type-II Censored Exponential Data, IEEE Transactions on Reliability, 47, 142-146.
Tseng, S. T. and Wen, Z. C. (2000). Step-Stress Accelerated Degradation Analysis for Highly Reliable Products, Journal of Quality Technology, 32, 209-216.
Lawless, J. F. (1982). Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York, NY.
Cheng, K. F. and Chen, C. H. (1988). Estimation of the Weibull Parameters with Grouped Data, Communications in Statistics -Theory Methods, 17, 325-341.
Lui, K. J., Steffey, D. and Pugh, J. K. (1993). Sample Size Determination for Grouped Exponential Obervations: A Cost Function Approach, Biometrical Journal, 35, 677-688.
Chen, Z. and Mi, J. (1996). Confidence Interval for the Mean of the Exponential Distribution, based on Grouped Data, IEEE Trans -actions on Reliability, 45, 671-677.
Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data, New York: Wiley.
Aggarwala, R. (2001). Progressive Interval Censoring: Some Mathem- atical Results with Applications Inference, Communications in Statistics-Theory Methods, 30, 1921-1935.
Epstein, B. (1954). Truncated Life Tests in the Exponential Case, Annals of Mathematical Statistics, 25, pp. 555-564.
Spurrier, J. D. and Wei, L. J. (1980). A Test of the Parameter of the Exponential Distribution in the Type I Censoring Case, Journal of American Statistical Association, 75, pp. 405-409.
Grant, E. L. and Leavenworth, R. S. (1996). Statistical Quality Control, McGraw-Hill, New York, NY.
Kim, S. H. and Yum, B. J. (2000). Comparisons of Exponential Life Test Plans With Intermittent Inspections, Journal of Quality Technology, 32, 217-230.
飛利浦RF小信號分立元器件產品設計手冊, http：//www.semiconductors.philips.com/acrobat/other/discretes/philips_rf_manual_4th_edition_appendix_chinese.pdf
A_open AX4PE Tube-g真空管極品主板試用手記, http：//www.beareyes.com.cn/2/lib/200304/30/20030430216.htm
認識真空管, http：//www.shanling.com/tube_01.html |
