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    政大機構典藏 > 資訊學院 > 資訊科學系 > 期刊論文 >  Item 140.119/148734
    Please use this identifier to cite or link to this item: https://nccur.lib.nccu.edu.tw/handle/140.119/148734


    Title: Towards Adversarial Robustness for Multi-Mode Data through Metric Learning
    Authors: 廖文宏
    Liao, Wen-Hung;Khan, Sarwar;Chen, Jun-Cheng;Chen, Chu-Song
    Contributors: 資訊系
    Keywords: adversarial attacks;adversarial training;classification;metric learning;multi-mode;prototypes
    Date: 2023-07
    Issue Date: 2023-12-13 14:16:36 (UTC+8)
    Abstract: Adversarial attacks have become one of the most serious security issues in widely used deep neural networks. Even though real-world datasets usually have large intra-variations or multiple modes, most adversarial defense methods, such as adversarial training, which is currently one of the most effective defense methods, mainly focus on the single-mode setting and thus fail to capture the full data representation to defend against adversarial attacks. To confront this challenge, we propose a novel multi-prototype metric learning regularization for adversarial training which can effectively enhance the defense capability of adversarial training by preventing the latent representation of the adversarial example changing a lot from its clean one. With extensive experiments on CIFAR10, CIFAR100, MNIST, and Tiny ImageNet, the evaluation results show the proposed method improves the performance of different state-of-the-art adversarial training methods without additional computational cost. Furthermore, besides Tiny ImageNet, in the multi-prototype CIFAR10 and CIFAR100 where we reorganize the whole datasets of CIFAR10 and CIFAR100 into two and ten classes, respectively, the proposed method outperforms the state-of-the-art approach by 2.22% and 1.65%, respectively. Furthermore, the proposed multi-prototype method also outperforms its single-prototype version and other commonly used deep metric learning approaches as regularization for adversarial training and thus further demonstrates its effectiveness.
    Relation: Sensors, Vol.23, No.13, 6173
    Data Type: article
    DOI 連結: https://doi.org/10.3390/s23136173
    DOI: 10.3390/s23136173
    Appears in Collections:[資訊科學系] 期刊論文

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